Documentation
Modules
Interactive PDL demo for spectroscopic ellipsometry analysis
Variable Angle Spectroscopic Ellipsometry analysis
Optical dispersion models for spectroscopic ellipsometry
Effective Medium Approximation mixing models for composite thin films
Load and interpolate tabulated optical constants
Global optimization algorithms for ellipsometry model fitting
Named parameters with bounds, vary/fix control, and internal transformations for model fitting
Transfer Matrix Method for multilayer thin film optics